<?xml version="1.0" encoding="UTF-8"?><!DOCTYPE article  PUBLIC "-//NLM//DTD Journal Publishing DTD v3.0 20080202//EN" "http://dtd.nlm.nih.gov/publishing/3.0/journalpublishing3.dtd"><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" dtd-version="3.0" xml:lang="en" article-type="research article"><front><journal-meta><journal-id journal-id-type="publisher-id">JAMP</journal-id><journal-title-group><journal-title>Journal of Applied Mathematics and Physics</journal-title></journal-title-group><issn pub-type="epub">2327-4352</issn><publisher><publisher-name>Scientific Research Publishing</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.4236/jamp.2016.412217</article-id><article-id pub-id-type="publisher-id">JAMP-73127</article-id><article-categories><subj-group subj-group-type="heading"><subject>Articles</subject></subj-group><subj-group subj-group-type="Discipline-v2"><subject>Physics&amp;Mathematics</subject></subj-group></article-categories><title-group><article-title>
 
 
  Designing Sensors Using Nano-Junctions
 
</article-title></title-group><contrib-group><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Vijay</surname><given-names>K. Lamba</given-names></name><xref ref-type="aff" rid="aff1"><sup>1</sup></xref></contrib><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>O.</surname><given-names>P. Garg</given-names></name><xref ref-type="aff" rid="aff2"><sup>2</sup></xref></contrib></contrib-group><aff id="aff1"><addr-line>Global College of Engineering &amp;amp; Technology, Khanpur Khui, India</addr-line></aff><aff id="aff2"><addr-line>RKSD College, Kaithal, India</addr-line></aff><pub-date pub-type="epub"><day>05</day><month>12</month><year>2016</year></pub-date><volume>04</volume><issue>12</issue><fpage>2247</fpage><lpage>2253</lpage><history><date date-type="received"><day>September</day>	<month>23,</month>	<year>2016</year></date><date date-type="rev-recd"><day>Accepted:</day>	<month>December</month>	<year>26,</year>	</date><date date-type="accepted"><day>December</day>	<month>29,</month>	<year>2016</year></date></history><permissions><copyright-statement>&#169; Copyright  2014 by authors and Scientific Research Publishing Inc. </copyright-statement><copyright-year>2014</copyright-year><license><license-p>This work is licensed under the Creative Commons Attribution International License (CC BY). http://creativecommons.org/licenses/by/4.0/</license-p></license></permissions><abstract><p>
 
 
  Nanowire field effect transistors can be modeled for ultrasensitive charge detection based bio- or chemical sensors. As critical dimensions of the nanowire sensor can be of the same order of size of biological molecules or chemical species yielding exceptional sensing possibilities. In addition, the large surface/volume ratio will give high sensitivities simply because surface effects dominate over bulk properties. Thus, we modeled Si nanowire with different geometries in the different chemical environment using NEGF approach. To analyze the performance, the sensitivity of Si nanowire with different cross sections including circular, rectangular, and triangular is derived by two definitions. It is calculated that the sensitivity of Si nanowire with different structures is a function of geometrical parameters and doping density. It is illustrated that the sensitivity varies inversely with cross-section area, doping density, and also the length of nanowire.
 
</p></abstract><kwd-group><kwd>SINWs</kwd><kwd> Doping</kwd><kwd> NEGF</kwd><kwd> DFT</kwd></kwd-group></article-meta></front><body><sec id="s1"><title>1. Introduction</title><p>In recent years, silicon nanostructures have attracted great interest as a building block for micro-electro-mechanical systems (MEMS), nano-electro-mechanical systems (NEMS) and nano-electronic devices. For example, silicon nanostructures find applications in diverse areas such as sensors, bio-sensors, medical technology, and communication technologies [<xref ref-type="bibr" rid="scirp.73127-ref1">1</xref>] [<xref ref-type="bibr" rid="scirp.73127-ref2">2</xref>] . Developing accurate and efficient models to predict the material properties of silicon nanostructures plays an important role in the design, characterization, and optimization of MEMS/NEMS and nano-electronic devices [<xref ref-type="bibr" rid="scirp.73127-ref3">3</xref>] [<xref ref-type="bibr" rid="scirp.73127-ref4">4</xref>] [<xref ref-type="bibr" rid="scirp.73127-ref5">5</xref>] [<xref ref-type="bibr" rid="scirp.73127-ref6">6</xref>] . Since the typical dimension of silicon nanostructures can vary from a few nanometers to several hundred nanometers or even micrometers, the development of an appropriate model to accurately and efficiently predict the mechanical, and electrical response due to the external loadings and morphologies at different length scales is one of the main issues in a full device simulation of nanostructures.</p><p>Atomistic simulation methods such as first-principles quantum-mechanical methods [<xref ref-type="bibr" rid="scirp.73127-ref7">7</xref>] [<xref ref-type="bibr" rid="scirp.73127-ref8">8</xref>] , molecular dynamics (MD) and Monte Carlo (MC) simulations [<xref ref-type="bibr" rid="scirp.73127-ref9">9</xref>] [<xref ref-type="bibr" rid="scirp.73127-ref10">10</xref>] are generally accurate for the analysis of nanostructures. However, the extremely high computational cost prohibits the application of the atomistic methods at the device level. On the other hand, classical continuum theories which are based on continuum assumptions are efficient and accurate at macroscopic scale, but they may not be directly applicable for devices with nanometer features. To achieve the goal of accurately capturing the atomistic physics and yet retaining the efficiency at various length scales, multi-scale modeling and simulation techniques have recently gained significant interest. So we used NEGF theory for Si nanowire with different geometries in the different chemical environment to analyze the performance, the sensitivity of Si nanowire with different cross sections.</p><p>In Section 2, we discuss the system model we used; Section 3 consists of NEGF-DFT formalism; in Section 4, we model the effect of encapsulation, &amp; deformed structures, with results &amp; conclusions in Section 5.</p></sec><sec id="s2"><title>2. Model System</title><p>A general model for detecting molecules using Si-NWs is shown in <xref ref-type="fig" rid="fig1">Figure 1</xref>. The system consists of a Si-NW between two electrodes whose surface is functionalized. The electrodes are protected from the external environment by an oxide layer to avoid any undesired conductance change due to modification of electrode work function.</p><p>Due to the presence of native oxide on the NW surface, we assume that the negligible charge transfer is expected to take place between the molecule and the semiconductor. However, it is reported in [<xref ref-type="bibr" rid="scirp.73127-ref11">11</xref>] that the complimentary change in conductance for P-type and N-type doped NWs due to same organic molecules, which indicates that electrostatic interaction dominates the response. In this paper, we consider the analysis of sensitivity of Si nanowire with different cross sections only and neglect the effect of any surface states, as the response of a sensor is characterized in terms of its selectivity, settling time, and sensitivity.</p><fig-group id="fig1"><label><xref ref-type="fig" rid="fig1">Figure 1</xref></label><caption><title>(a) Schematic of SiNW model, (b) view of SiNW with dopant in virtual NanoLab.</title></caption><fig id ="fig1_1"><label> (b)</label><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/9-1720703x2.png"/></fig><fig id ="fig1_2"><label></label><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/9-1720703x3.png"/></fig></fig-group><p>Selectivity denotes the ability of receptors to bind with the desired target in the presence of various other (possibly similar) molecules and is entirely determined by the functionalization schemes [<xref ref-type="bibr" rid="scirp.73127-ref12">12</xref>] . The time taken by the sensor to produce a stable signal change defines the settling time, and is determined by molecule concentration, diffusion coefficients, and conjugation affinity to the receptor molecules [<xref ref-type="bibr" rid="scirp.73127-ref13">13</xref>] . Finally, sensitivity corresponds to the relative change in sensor characteristics upon attachment of target molecules on nanowire surface, which can be determined by the electrostatics of the system.</p></sec><sec id="s3"><title>3. Theoretical Approach</title><p>The device model applied in the transport calculation consists of three parts, the studied material and two electrodes under bias V<sub>b</sub>. Thus the Hamiltonian H for full systems can be of the form:</p><disp-formula id="scirp.73127-formula600"><label>(1)</label><graphic position="anchor" xlink:href="http://html.scirp.org/file/9-1720703x4.png"  xlink:type="simple"/></disp-formula><p>were H<sub>LL</sub><sub>/RR</sub> are the Hamiltonian for left/right electrode and H<sub>CC</sub> + H<sub>LC</sub> + H<sub>RC</sub> gives Hamiltonian for extended molecule, consisting of molecule in addition to three layer of surface atoms of two electrodes. Here, each term is represented as</p><disp-formula id="scirp.73127-formula601"><label>(2)</label><graphic position="anchor" xlink:href="http://html.scirp.org/file/9-1720703x5.png"  xlink:type="simple"/></disp-formula><p>were <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/9-1720703x6.png" xlink:type="simple"/></inline-formula> represents site energy of electron/hole positioned on I molecule, and <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/9-1720703x7.png" xlink:type="simple"/></inline-formula> symbolize the creation and annihilation operator. As the definition of the current from the left electrode to the pinned system is</p><disp-formula id="scirp.73127-formula602"><label>(3)</label><graphic position="anchor" xlink:href="http://html.scirp.org/file/9-1720703x8.png"  xlink:type="simple"/></disp-formula><p>Thus using</p><disp-formula id="scirp.73127-formula603"><label>(4)</label><graphic position="anchor" xlink:href="http://html.scirp.org/file/9-1720703x9.png"  xlink:type="simple"/></disp-formula><p>we get</p><disp-formula id="scirp.73127-formula604"><label>(5)</label><graphic position="anchor" xlink:href="http://html.scirp.org/file/9-1720703x10.png"  xlink:type="simple"/></disp-formula><p>Combining green function we get</p><disp-formula id="scirp.73127-formula605"><label>(6)</label><graphic position="anchor" xlink:href="http://html.scirp.org/file/9-1720703x11.png"  xlink:type="simple"/></disp-formula><p>Here <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/9-1720703x12.png" xlink:type="simple"/></inline-formula> stands for retarded green function defined as</p><disp-formula id="scirp.73127-formula606"><graphic  xlink:href="http://html.scirp.org/file/9-1720703x13.png"  xlink:type="simple"/></disp-formula><p>were <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/9-1720703x14.png" xlink:type="simple"/></inline-formula> and <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/9-1720703x15.png" xlink:type="simple"/></inline-formula> are an infinitesimal imaginary value and self energy elements which includes influence of electrodes. For the steady state</p><disp-formula id="scirp.73127-formula607"><label>. (7)</label><graphic position="anchor" xlink:href="http://html.scirp.org/file/9-1720703x16.png"  xlink:type="simple"/></disp-formula><p>Similarly we calculate for I<sub>LL</sub>, I<sub>RR</sub>, I<sub>CC</sub>, I<sub>CR</sub>, etc.</p><p>Thus</p><disp-formula id="scirp.73127-formula608"><label>(8)</label><graphic position="anchor" xlink:href="http://html.scirp.org/file/9-1720703x17.png"  xlink:type="simple"/></disp-formula><p>Here S is the overlap matrix and I stands for identity operator. We describe overlap matrix is close to identity matrix, thus matrix calculation</p><disp-formula id="scirp.73127-formula609"><label>(9)</label><graphic position="anchor" xlink:href="http://html.scirp.org/file/9-1720703x18.png"  xlink:type="simple"/></disp-formula><p>The solution of G<sub>CC</sub> is</p><disp-formula id="scirp.73127-formula610"><label>(10)</label><graphic position="anchor" xlink:href="http://html.scirp.org/file/9-1720703x19.png"  xlink:type="simple"/></disp-formula><p>where, <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/9-1720703x20.png" xlink:type="simple"/></inline-formula>, and <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/9-1720703x20.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/9-1720703x21.png" xlink:type="simple"/></inline-formula> are self energies corresponding with two leads respectively. The transmission probability is related to the Green function and can be described like</p><disp-formula id="scirp.73127-formula611"><label>(11)</label><graphic position="anchor" xlink:href="http://html.scirp.org/file/9-1720703x22.png"  xlink:type="simple"/></disp-formula><disp-formula id="scirp.73127-formula612"><label>(12)</label><graphic position="anchor" xlink:href="http://html.scirp.org/file/9-1720703x23.png"  xlink:type="simple"/></disp-formula><p>Tr means the trace analyzed. Thus using above equation we get transmission function of the systems. The electron transport calculations are performed using NEGF combined with DFT within the Landauer formalism [<xref ref-type="bibr" rid="scirp.73127-ref14">14</xref>] implemented in ATOMISTIX TOOLKIT [<xref ref-type="bibr" rid="scirp.73127-ref15">15</xref>] . The I-V characteristics are calculated by,</p><disp-formula id="scirp.73127-formula613"><label>(13)</label><graphic position="anchor" xlink:href="http://html.scirp.org/file/9-1720703x24.png"  xlink:type="simple"/></disp-formula><p>where e, h, and f<sub>L</sub><sub>(R)</sub> are electron charge, Planck’s constant, and the Fermi distribution functions at left (right) electrode, respectively. T(E, V<sub>b</sub>) is the transmission coefficient at energy E and bias voltage V<sub>b</sub>. We work with the Perdew-Zunger exchange and correlation functional [<xref ref-type="bibr" rid="scirp.73127-ref16">16</xref>] within the local density approximation. Norm-conserving pseudo potentials are used to describe the coreelectrons for all atoms. We have assumed the diameters SiNWs we used are less than 2 nm, Si-Si bond length is almost equal to bulk Si crystal. The nanowires we adopted had different cross section and in different sizes, and the surface is fully hydrogen terminated to eliminate the contribution of dangling bonds. We first of all calculated electronic band structures of SiNWs using ATOMISTIX TOOLKIT, which is excellently matched with experimental data [<xref ref-type="bibr" rid="scirp.73127-ref17">17</xref>] [<xref ref-type="bibr" rid="scirp.73127-ref18">18</xref>] [<xref ref-type="bibr" rid="scirp.73127-ref19">19</xref>] .</p></sec><sec id="s4"><title>4. Result &amp; Conclusions</title><p>On analysis we found that with the increase in diameter of SiNWs the band gap decreases and it is inversely proportional to the diameter of wire i.e.</p><disp-formula id="scirp.73127-formula614"><label>(14)</label><graphic position="anchor" xlink:href="http://html.scirp.org/file/9-1720703x25.png"  xlink:type="simple"/></disp-formula><p>From <xref ref-type="fig" rid="fig2">Figure 2</xref>, we find that gap width varied from 3.5 eV to 0.75 eV, for the variation in cross section area from 0.5 nm<sup>2</sup> to 1.5 nm<sup>2</sup> for [<xref ref-type="bibr" rid="scirp.73127-ref110">110</xref>] [<xref ref-type="bibr" rid="scirp.73127-ref111">111</xref>] [<xref ref-type="bibr" rid="scirp.73127-ref112">112</xref>] series.</p><p>Our results are in agreements and perform the same trends with the experimental results [<xref ref-type="bibr" rid="scirp.73127-ref20">20</xref>] . Here, the size dependence indicates the quantum confinement, for the reason that the movement of electrons was confined in the plane perpendicular to wire axis. Energy band near Fermi energy level was effected since the diameter of wires is small, and the effective mass in confinement plane for [<xref ref-type="bibr" rid="scirp.73127-ref111">111</xref>] is smaller than that for [<xref ref-type="bibr" rid="scirp.73127-ref110">110</xref>] wire, and energy shift is large, which indicates the dependence of energy gap on orientation as well, but <xref ref-type="fig" rid="fig3">Figure 3</xref> indicates slight dependence only.</p><p>As impurities and dopants are adsorbed on SiNW surface, so they influence the electronic structure, which causes the change in conductance/transport properties. We calculate band structures for nanowires doped with N, &amp; -OH using ATOMISTIX TOOLKIT. Interestingly, the different dopant adsorbed, clearly resulted in different band structure. Thus, all the results shown in <xref ref-type="fig" rid="fig4">Figure 4</xref> are evidence that the different adsorbents modify the band structures in different ways so, we can use SiNWs as</p><fig id="fig2"  position="float"><label><xref ref-type="fig" rid="fig2">Figure 2</xref></label><caption><title> Band gap of the SiNWs versus the cross-sectional diameter, blue dots is for [<xref ref-type="bibr" rid="scirp.73127-ref110">110</xref>], brown for [<xref ref-type="bibr" rid="scirp.73127-ref111">111</xref>], and green for experimental data taken from reference [<xref ref-type="bibr" rid="scirp.73127-ref17">17</xref>] for [<xref ref-type="bibr" rid="scirp.73127-ref111">111</xref>]</title></caption><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/9-1720703x26.png"/></fig><fig id="fig3"  position="float"><label><xref ref-type="fig" rid="fig3">Figure 3</xref></label><caption><title> Band gap of the SiNWs versus the cross-sectional area, blue dots is for [<xref ref-type="bibr" rid="scirp.73127-ref111">111</xref>], brown for [<xref ref-type="bibr" rid="scirp.73127-ref112">112</xref>]</title></caption><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/9-1720703x27.png"/></fig><fig-group id="fig4"><label><xref ref-type="fig" rid="fig4">Figure 4</xref></label><caption><title> Diagram for electronic band structure (a) SiNW, (b) SiNW with N doped, (c) SiNW with -OH group.</title></caption><fig id ="fig4_1"><label> (b)</label><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/9-1720703x28.png"/></fig></fig-group><p>sensors by tuning the band gaps through controlling surface density of dopants/surface treatments.</p></sec><sec id="s5"><title>Cite this paper</title><p>Lamba, V.K. and Garg, O.P. 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