<?xml version="1.0" encoding="UTF-8"?><!DOCTYPE article  PUBLIC "-//NLM//DTD Journal Publishing DTD v3.0 20080202//EN" "http://dtd.nlm.nih.gov/publishing/3.0/journalpublishing3.dtd"><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" dtd-version="3.0" xml:lang="en" article-type="research article"><front><journal-meta><journal-id journal-id-type="publisher-id">CS</journal-id><journal-title-group><journal-title>Circuits and Systems</journal-title></journal-title-group><issn pub-type="epub">2153-1285</issn><publisher><publisher-name>Scientific Research Publishing</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.4236/cs.2012.34047</article-id><article-id pub-id-type="publisher-id">CS-23644</article-id><article-categories><subj-group subj-group-type="heading"><subject>Articles</subject></subj-group><subj-group subj-group-type="Discipline-v2"><subject>Computer Science&amp;Communications</subject><subject> Engineering</subject><subject> Physics&amp;Mathematics</subject></subj-group></article-categories><title-group><article-title>
 
 
  On-Chip Inductor Technique for Improving LNA Performance Operating at 15 GHz
 
</article-title></title-group><contrib-group><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>l-Sayed</surname><given-names>A. M. Hasaneen</given-names></name><xref ref-type="aff" rid="aff1"><sup>1</sup></xref><xref ref-type="corresp" rid="cor1"><sup>*</sup></xref></contrib><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Nagwa</surname><given-names>Okely</given-names></name><xref ref-type="aff" rid="aff1"><sup>1</sup></xref><xref ref-type="corresp" rid="cor1"><sup>*</sup></xref></contrib></contrib-group><aff id="aff1"><addr-line>Electrical Engineering Department, El-Minia University, El-Minia, Egypt</addr-line></aff><author-notes><corresp id="cor1">* E-mail:<email>hasaneen@netzero.net(LAMH)</email>;<email>ekamrani@gmail.com(NO)</email>;</corresp></author-notes><pub-date pub-type="epub"><day>30</day><month>10</month><year>2012</year></pub-date><volume>03</volume><issue>04</issue><fpage>334</fpage><lpage>341</lpage><history><date date-type="received"><day>August</day>	<month>8,</month>	<year>2012</year></date><date date-type="rev-recd"><day>September</day>	<month>5,</month>	<year>2012</year>	</date><date date-type="accepted"><day>September</day>	<month>12,</month>	<year>2012</year></date></history><permissions><copyright-statement>&#169; Copyright  2014 by authors and Scientific Research Publishing Inc. </copyright-statement><copyright-year>2014</copyright-year><license><license-p>This work is licensed under the Creative Commons Attribution International License (CC BY). http://creativecommons.org/licenses/by/4.0/</license-p></license></permissions><abstract><p>
 
 
  This paper presents a technique for low noise figure reduction of low-noise amplifier (LNA). The proposed LNA is designed in a source degeneration technique that offers lower noise figure. The resistance of the on-chip inductor is reduced by using multilayer that significantly reduces the thermal noise due to spiral inductor. Also, using spiral inductor as a gate inductor reduces the effect of the input parasitic capacitance on the noise figure and provides a good matching at the input and output of the LNA. The results of the LNA using multilayer on-chip inductor compared will off-chip inductor have been illustrated. It shows that the proposed technique reduces significantly the noise figure and improves the matching. The proposed LNA is designed in 0.13 μm process with 1.3 V supply voltage and simulated using Advanced Design System (ADS) software. The simulation results show that the LNA is unconditionally stable and provides a forward gain of 11.087 dB at operating frequency of 15 GHz with 1.784 dB noise figure and input and output impedance matching of –17.93 dB, and –10.04 dB.
 
</p></abstract><kwd-group><kwd>Low Noise Amplifier; On-Chip Inductor; Noise Figure; Cascade Amplifier; Scattering Matrix</kwd></kwd-group></article-meta></front><body><sec id="s1"><title>1. Introduction</title><p>The communication market has been growing very fast during the last decade especially for mobile communication systems. The low noise amplifier is one of the most essential building blocks in the communication circuits. It can be found in the almost of the commercial and military receivers. The first stage followed the antenna, LNA, is the most critical stage because its noise figure dominates the overall communication systems. The main function of the LNA is to amplify the incoming signal while adding the minimum possible noise and also provides impedance matching. Additional requirement to the LNA is the low power consumption, which is especially important in portable communications systems<sup> </sup>[<xref ref-type="bibr" rid="scirp.23644-ref1">1</xref>]. Various techniques to improve the LNA performances were proposed [2-5].</p><p>In this paper, we propose a new technique for improving LNA performance. The proposed multilayer on-chip spiral inductor technique significantly decreases the value of inductor series resistance that reduces the contribution of the spectral noise current due inductor series resistance and provides a good matching at the LNA input and output. It also reduces the effect of the parasitic capacitance at the input of the LNA which considers one of the biggest problems in the LNA design. In our design, we use inductive source degeneration technique [<xref ref-type="bibr" rid="scirp.23644-ref5">5</xref>]. Source degeneration technique provides no additional noise generation since the real part of the input impedance does not correspond to a physical resistor that offers lower noise figure than the common-gate LNA. Although the distributed amplifiers [<xref ref-type="bibr" rid="scirp.23644-ref6">6</xref>] normally provide wide bandwidth characteristics but it tends to consume a large dc current due to the distribution of multiple amplifying stages, which make them unsuitable for low-power applications. The resistive shunt-feedback-based amplifiers [<xref ref-type="bibr" rid="scirp.23644-ref7">7</xref>] provide good wideband matching and flat gain, but they tend to suffer from poor noise figure (NF) and large power dissipation. It makes the inductive source degeneration technique the best topology for LNA with high gain, low noise figure, good matching and good stability.</p><p>This paper is organized as follows. Section 2 describes the proposed LNA circuit and analysis. Section 3 presents modeling of spiral inductor and Section 4 describes the noise analysis. The stability of the LNA is described in Section 5. Results and discussions are illustrated in Section 6 and followed by a conclusion in Section 7.</p></sec><sec id="s2"><title>2. LNA Circuit Description and Analysis</title><p><xref ref-type="fig" rid="fig1">Figure 1</xref>(a) shows the schematic circuit diagram of the proposed CMOS LNA with cascoded topology. An inductive source degeneration technique is used to provide no additional noise generation. The cascode topology reduces the influence of the miller capacitance effect which strongly limits the frequency performance and gives a rise to a very poor reverse isolation [<xref ref-type="bibr" rid="scirp.23644-ref8">8</xref>]. It is also used to decouple miller effect from the gain of the circuit and to simplify the design matching network to the antenna. Because LNA directly interfaces with the antenna, a 50 Ω impedance matching is usually required at its input and it is very important to avoid reflections over the transmission line feeding LNA. So, additional tuning components are usually used to match it to the source impedance. The circuit shown in <xref ref-type="fig" rid="fig1">Figure 1</xref>(a) has purely capacitive input impedance. In order to create a resistive input, a source generation inductor L<sub>S</sub> is connected to the source of the input transistor M<sub>1</sub> to provide an effective resistive input without contributing additional noise. The gate inductor L<sub>g</sub> is used for input impedance matching which is required to transform upwards the equivalent impedance looking into the gate of M<sub>1</sub> and also it is used to optimize the noise figure.</p><p><xref ref-type="fig" rid="fig1">Figure 1</xref>(b) shows the small-signal equivalent circuit for the input transistor M<sub>1</sub> and the overall LNA circuit. The capacitance C<sub>gs</sub> represents the gate-source capacitance of the input transistor M<sub>1</sub>, g<sub>m</sub> is the MOS transconductance, and R<sub>s</sub> is the source resistance, typically 50 Ω.</p><p>The input impedance can be expressed as:</p><disp-formula id="scirp.23644-formula138188"><label>(1)</label><graphic position="anchor" xlink:href="7-7600194\4f5066aa-52ef-4a87-823d-f7115f65d677.jpg"  xlink:type="simple"/></disp-formula><p>where</p><disp-formula id="scirp.23644-formula138189"><label>(2)</label><graphic position="anchor" xlink:href="7-7600194\3a14943e-eb91-4f6e-9f23-20561d16ccb4.jpg"  xlink:type="simple"/></disp-formula><p>Substituting (2) into (1) gives:</p><disp-formula id="scirp.23644-formula138190"><label>(3)</label><graphic position="anchor" xlink:href="7-7600194\d99d5411-607f-4415-81fd-4f9e5f7effaf.jpg"  xlink:type="simple"/></disp-formula><p>The real part of Z<sub>in</sub> is given by:</p><p><img src="7-7600194\49e7ee27-9a83-4035-bad3-55f72a9dc158.jpg" /></p><p>where r<sub>g</sub> is the gate resistance of MOS transistor. Neglecting the gate resistance, the real part of the input impedance can be expressed as:</p><disp-formula id="scirp.23644-formula138191"><label>(4)</label><graphic position="anchor" xlink:href="7-7600194\4197087b-9299-401a-805f-8589944d4ba3.jpg"  xlink:type="simple"/></disp-formula><p>For matching purpose, the real part of the input impedance should be equal to the source resistance. It is given by:</p><disp-formula id="scirp.23644-formula138192"><label>(5)</label><graphic position="anchor" xlink:href="7-7600194\5e4b7d05-2bfc-4c0e-9a18-6e5379c79a15.jpg"  xlink:type="simple"/></disp-formula><p>where <img src="7-7600194\6ea67d2c-203b-4239-8809-0f791bd09938.jpg" /> is the unity-current gain angular frequency of the MOS transistor and can be approximated as<sup> </sup>[<xref ref-type="bibr" rid="scirp.23644-ref8">8</xref>]:</p><disp-formula id="scirp.23644-formula138193"><label>(6)</label><graphic position="anchor" xlink:href="7-7600194\2e0f62cb-585f-4cd7-96cd-2975c29c0b63.jpg"  xlink:type="simple"/></disp-formula><p>The effective transconductance of the matched device of the LNA is defined as the ratio of the input transistor output current to the input voltage and given by:</p><disp-formula id="scirp.23644-formula138194"><label>(7)</label><graphic position="anchor" xlink:href="7-7600194\7ae2befe-2399-4ad8-84c0-094f50ced266.jpg"  xlink:type="simple"/></disp-formula><p>In this case, <img src="7-7600194\c775adca-e1f6-416e-9ea1-96b9e56ff28c.jpg" />V<sub>gs</sub> &amp;<img src="7-7600194\aab24096-5caa-4296-94c8-bfbb6996eb47.jpg" />, where <img src="7-7600194\17d2d958-9daa-463f-8d41-42a76c2e6f7b.jpg" /> is the quality factor of the input RLC tank which formed from the input matching network and it is given by:</p><disp-formula id="scirp.23644-formula138195"><label>(8)</label><graphic position="anchor" xlink:href="7-7600194\7fa9eee1-0b40-4b03-953f-1e5e0bf8a909.jpg"  xlink:type="simple"/></disp-formula><p>and</p><disp-formula id="scirp.23644-formula138196"><label>(9)</label><graphic position="anchor" xlink:href="7-7600194\92611512-a01b-4613-926d-007a30433bb1.jpg"  xlink:type="simple"/></disp-formula><p>Substituting (8) into (7), the input stage transconductance will be:</p><disp-formula id="scirp.23644-formula138197"><label>(10)</label><graphic position="anchor" xlink:href="7-7600194\d9e75164-a56b-4d67-b010-eb06b5f3bf33.jpg"  xlink:type="simple"/></disp-formula><p>The LNA input stage transconductance given by (10) is independent on the actual input device transconductance g<sub>m</sub> which considered a merit for LNA circuit.</p><p>At output, the output inductance (L<sub>o</sub>) of the on-chip inductor is used to resonate with the cascode output capacitance at the resonance frequency. The disadvantage of the on-chip inductor is the series resistance and overlap capacitance between the turns of spiral and the cross-under layer. The series resistance of the spiral decreases the inductor quality factor which has a significant effect on the quality factor of the output tank. In this work, the series resistance is decreased significantly by using multilayer technique as we will discuss in next the sections and the overlap capacitance is used as the output capacitance for LNA circuit. So, on-chip spiral inductor becomes preferable compared to off-chip inductor.</p><p>At the resonance frequency, the voltage gain of the LNA shown in <xref ref-type="fig" rid="fig1">Figure 1</xref>(a) can be expressed as:</p><disp-formula id="scirp.23644-formula138198"><label>(11)</label><graphic position="anchor" xlink:href="7-7600194\4c5938a1-0106-435d-94de-b674e1cf6215.jpg"  xlink:type="simple"/></disp-formula><p>and</p><disp-formula id="scirp.23644-formula138199"><label>(12)</label><graphic position="anchor" xlink:href="7-7600194\705e9754-33e2-42ae-9cf3-241806cb9956.jpg"  xlink:type="simple"/></disp-formula><p>where R<sub>ot</sub> is the output resistance of the cascode architecture and R<sub>l</sub> is the load resistance. Q<sub>ind</sub> (ωL<sub>o</sub>) is the output inductor parallel resistance. The output resistance is given by:</p><p><img src="7-7600194\c7023775-1e59-4800-a426-bd1194892e9c.jpg" /></p><p>where g<sub>m</sub><sub>2</sub>, r<sub>o</sub><sub>1</sub> and r<sub>o</sub><sub>2</sub> are the transconductance of cascode transistor, and output resistance of input and cascode transistors, respectively.</p><p>If the load resistance value is small compared with the output resistance of the cascode and parallel resistance of the output inductor, the overall output resistance will be:</p><p><img src="7-7600194\e9ec6d97-7e33-48c8-a283-b1f1725ada71.jpg" /></p><p>and</p><disp-formula id="scirp.23644-formula138200"><label>(13)</label><graphic position="anchor" xlink:href="7-7600194\25aefcff-7c50-49b1-b4d0-24725af97c6e.jpg"  xlink:type="simple"/></disp-formula><p>The voltage gain of the low noise amplifier should be set to maximize the dynamic range of the total receiver. It can be accomplished if the next blocks are very linear but the noise will be increased and vice versa [<xref ref-type="bibr" rid="scirp.23644-ref8">8</xref>].</p></sec><sec id="s3"><title>3. Modeling of Spiral Inductor</title><p>A lumped circuit model of on-chip spiral inductor grown on Si substrate is shown in <xref ref-type="fig" rid="fig2">Figure 2</xref> [9-11]. L<sub>S</sub> and r<sub>S</sub> are the series inductance and resistance of the spiral respectively. C<sub>S</sub> is the overlap capacitance between the turns of spiral and the cross-under layer. C<sub>OX</sub> is the oxide capacitance between the spiral and the substrate. R<sub>Si</sub> and C<sub>Si</sub> are the parameters modeling substrate losses and capacitive effects, respectively. The inductance of a spiral is a complex function of its geometry and includes both self and mutual inductances. The expressions for on-chip spiral inductor parameters are given by [<xref ref-type="bibr" rid="scirp.23644-ref9">9</xref>]:</p><disp-formula id="scirp.23644-formula138201"><label>(14)</label><graphic position="anchor" xlink:href="7-7600194\4cfdb068-e7c6-4aea-bfd3-70f006efe63d.jpg"  xlink:type="simple"/></disp-formula><disp-formula id="scirp.23644-formula138202"><label>(15)</label><graphic position="anchor" xlink:href="7-7600194\bde3e31b-38fd-4450-b86d-a5de5f00fcb1.jpg"  xlink:type="simple"/></disp-formula><disp-formula id="scirp.23644-formula138203"><label>(16)</label><graphic position="anchor" xlink:href="7-7600194\46f9068e-4cbf-49dd-bf38-b1744717c9f6.jpg"  xlink:type="simple"/></disp-formula><disp-formula id="scirp.23644-formula138204"><label>(17)</label><graphic position="anchor" xlink:href="7-7600194\b26646f3-79d0-4659-81da-eb3ffc711c11.jpg"  xlink:type="simple"/></disp-formula><disp-formula id="scirp.23644-formula138205"><label>(18)</label><graphic position="anchor" xlink:href="7-7600194\c45e9362-e144-4651-87ea-411cbda25d0d.jpg"  xlink:type="simple"/></disp-formula><disp-formula id="scirp.23644-formula138206"><label>(19)</label><graphic position="anchor" xlink:href="7-7600194\c570fd04-cf06-4a5f-abee-48fc5c18dc64.jpg"  xlink:type="simple"/></disp-formula><p>where l is the wire length, w is the width of the metal conductor, and t is the thickness of the metal conductor. The substrate parasitic capacitances and resistances cause</p><p>high losses in the circuit that present several challenges for implementing monolithic gigahertz circuitry. The placement of a patterned ground shield (PGS) beneath the spiral inductor eliminates the substrate parasites that improve the inductor performance [<xref ref-type="bibr" rid="scirp.23644-ref12">12</xref>]. A patterned ground shield is used in our calculations and simulations in this paper.</p></sec><sec id="s4"><title>4. Noise Analysis</title><p>The noise figure of LNA at operation frequency ω can be estimated by analyzing the circuit shown in <xref ref-type="fig" rid="fig3">Figure 3</xref>. Five noise sources contribute the noise at the output of the low noise amplifier. The MOS transistor M<sub>1</sub> contributes by two of them. The noise sources are as follows:</p><p>1) the thermal noise of the channel current (i<sub>n,d</sub>). It has a power spectral density of:</p><disp-formula id="scirp.23644-formula138207"><label>(20)</label><graphic position="anchor" xlink:href="7-7600194\0068641b-f655-4b7a-9ac8-7c39f86e7b0a.jpg"  xlink:type="simple"/></disp-formula><p>where K is the Boltzman constant, T is the absolute temperature, γ is the bias dependent constant, and g<sub>dso</sub> is the drain-source conductance at V<sub>ds</sub> = 0 and it is defined as:</p><p><img src="7-7600194\fd992cdd-e6e8-4d58-9449-6f0d56929b0d.jpg" /></p><p>where α equals 1 for long channel and 0.85 for short channel transistors.</p><p>2) The gate induced current noise (i<sub>n,g</sub>): It has a power spectral density of:</p><disp-formula id="scirp.23644-formula138208"><label>(21)</label><graphic position="anchor" xlink:href="7-7600194\94672dae-314c-4183-9d36-48abd60eebae.jpg"  xlink:type="simple"/></disp-formula><p>and</p><p><img src="7-7600194\10d5f477-4f4c-401f-b5ea-88485f444372.jpg" /></p><p>Subsituting δg<sub>g</sub> in (21) gives:</p><disp-formula id="scirp.23644-formula138209"><label>(22)</label><graphic position="anchor" xlink:href="7-7600194\24175f2e-c6c4-4d82-9a67-0a6399bb9d4c.jpg"  xlink:type="simple"/></disp-formula><p>The gate current noise is related to the drain current noise and actually it is partially correlated to it with a correlation coefficient C given by:</p><disp-formula id="scirp.23644-formula138210"><label>(23)</label><graphic position="anchor" xlink:href="7-7600194\17437d9a-9cfe-45b7-9f3c-83f4896d1381.jpg"  xlink:type="simple"/></disp-formula><p>where C = j0.395 for short channel transistors, and the power spectral density of the gate induced current noise source can be expressed as:</p><p><img src="7-7600194\2bbfc43b-ffeb-40e1-8e53-ec5d8822ea69.jpg" /></p><p>or</p><disp-formula id="scirp.23644-formula138211"><label>(24)</label><graphic position="anchor" xlink:href="7-7600194\0e61729e-9374-47cf-a77b-61489a2c9aa1.jpg"  xlink:type="simple"/></disp-formula><p>The first term i<sub>n</sub><sub>,gc</sub> is the correlated term and the second term i<sub>n</sub><sub>,gu</sub> is the uncorrelated term.</p><p>3) The distributed gate resistance of CMOS transistor: It is also added noise to the output of the low noise amplifier and has a power spectral density equal to:</p><disp-formula id="scirp.23644-formula138212"><label>(25)</label><graphic position="anchor" xlink:href="7-7600194\63085696-714f-4834-8598-3a2385a407aa.jpg"  xlink:type="simple"/></disp-formula><p>where r<sub>g</sub> is distributed gate resistance given by:</p><p><img src="7-7600194\dc9cf8ef-3a66-4d7e-9af2-2e0b5d4f5dba.jpg" /></p><p>where g<sub>m</sub> is the input transistor transconductance.</p><p>4) The thermal noise due to source resistance: It has a power spectral density of:</p><disp-formula id="scirp.23644-formula138213"><label>(26)</label><graphic position="anchor" xlink:href="7-7600194\23623645-b48e-4c7f-ae1a-425d9e550444.jpg"  xlink:type="simple"/></disp-formula><p>5) Thermal noise of the output resistance: The low noise amplifier utilizes an LC resonator circuit at the drain of the output transistor to adjust the output of the LNA at a desired resonance frequency ω. The losses of the LC resonant circuit result from output inductor series resistance R<sub>d</sub>. The noise contribution of the series resistance in the LNA in the form of output noise current has a spectral density of:</p><disp-formula id="scirp.23644-formula138214"><label>(27)</label><graphic position="anchor" xlink:href="7-7600194\9c0dcba9-cecb-4ccf-9c01-91c51b908d01.jpg"  xlink:type="simple"/></disp-formula><p>In this paper, using multilayer on-chip spiral inductor technique significantly decreases the value of the inductor series resistance that reduces the contribution of the spectral noise current due to inductor series resistance. Cascode transistor M<sub>2</sub> has a minor influence on the noise behavior of the LNA and its contribution to the total noise is disregarded in the analysis. Finally, the noise factor F is the ratio between the total output noise power and the noise power due to the source resistance and it is give by:</p><disp-formula id="scirp.23644-formula138215"><label>(28)</label><graphic position="anchor" xlink:href="7-7600194\3ed1a771-2711-4342-bfc6-164299baac38.jpg"  xlink:type="simple"/></disp-formula><p>The above equation describes the noise figure for low noise amplifier without taking the parasitic capacitance C<sub>P</sub> effect into consideration. The parasitic capacitance C<sub>P</sub> is the total parallel parasitic capacitance due to the ESD protection diodes, QFN package parasitic and bonding pad structure. The value of C<sub>P</sub> is a fabrication dependency. If we include the parasitic capacitance effect on the noise figure, the noise factor will be:</p><disp-formula id="scirp.23644-formula138216"><label>(29)</label><graphic position="anchor" xlink:href="7-7600194\c3be6727-0d3c-45af-833e-4388340c2b66.jpg"  xlink:type="simple"/></disp-formula><p>From the above equation, the noise figure of the LNA directly depends on the parallel parasitic capacitance C<sub>P</sub>. With off-chip inductor, the value of C<sub>P</sub> is very high because the parasitic capacitance dominates the input capacitance of the LNA which considers one of the biggest problems in the LNA design. Therefore, it is difficult to reduce the total noise figure. Our solution for this problem is to use on-chip spiral inductor as a gate inductor. In this case, the parasitic capacitance becomes non-dominat. So, any value for parasitic capacitance, high or low, do not highly effect on the noise figure and LNA gain. It also gives a good matching at input and output of the LNA without using any other matching components. Therefore, we can design a stable LNA circuit that gives the desired performance without taking into consideration C<sub>P</sub> and other LNA complemented packaging.</p><p>There are many efforts for decreasing the effect of parasitic capacitance in noise figure as follow:</p><p>The first one considers a specific value for parasitic capacitance C<sub>p</sub> and takes the parasitic capacitance as a part of the circuit and builds the design upon this idea [<xref ref-type="bibr" rid="scirp.23644-ref13">13</xref>] as follow:</p><disp-formula id="scirp.23644-formula138217"><label>(30)</label><graphic position="anchor" xlink:href="7-7600194\4eea6150-71df-48c9-b57a-8e408d0b2bca.jpg"  xlink:type="simple"/></disp-formula><p>From the above equation, increasing C<sub>P</sub> increases the value of source inductor L<sub>S</sub> and lowers the value of gate inductor L<sub>g</sub>.</p><p>The second effort considers a specific value for C<sub>P</sub> and uses matching network at the input [<xref ref-type="bibr" rid="scirp.23644-ref14">14</xref>] and the value of the matching capacitor is defined from:</p><disp-formula id="scirp.23644-formula138218"><label>(31)</label><graphic position="anchor" xlink:href="7-7600194\947d78bc-5296-4863-988e-0992f6609a58.jpg"  xlink:type="simple"/></disp-formula><p>and</p><disp-formula id="scirp.23644-formula138219"><label>(32)</label><graphic position="anchor" xlink:href="7-7600194\de2f8a0f-3225-417a-b4c1-629a7ed7112a.jpg"  xlink:type="simple"/></disp-formula><p>where C<sub>m</sub> is the matching capacitor placed before gate inductor, C<sub>p</sub> is parasitic capacitance, and <img src="7-7600194\fad48a74-aa3a-4dae-9ec6-9d0995cfb5a1.jpg" /> is the resonance frequency.</p></sec><sec id="s5"><title>5. LNA Stability</title><p>The stability of an amplifier is a very important factor which must not be susceptible to unwanted oscillation. The stability factor of an amplifier is a frequency dependent. The amplifier may be stable at its design frequency and unstable at other frequencies. It is highly recommended that the amplifier circuit is made unconditionally stable at all frequencies to ensure that it does not produce unwanted oscillations. For unconditionally stable, the input and output stable circuits should not be clipped the outer edge of the Smith chart. The stability of a two-port network can be determined from its S-parameters and the load and source impedances. The stability is determined by using Rollets factors K and Δ, where K and Δ in terms of S-parameters at frequency of operation is determined as follow [<xref ref-type="bibr" rid="scirp.23644-ref15">15</xref>]:</p><disp-formula id="scirp.23644-formula138220"><label>(33)</label><graphic position="anchor" xlink:href="7-7600194\03747c79-6b13-4c5c-8145-619f3f72b7cb.jpg"  xlink:type="simple"/></disp-formula><disp-formula id="scirp.23644-formula138221"><label>(34)</label><graphic position="anchor" xlink:href="7-7600194\2a27c792-5957-4edf-92d6-74d5aa357dbb.jpg"  xlink:type="simple"/></disp-formula></sec><sec id="s6"><title>6. Results and Discussions</title><p>Cascode low noise amplifier with source degeneration technique shown in <xref ref-type="fig" rid="fig1">Figure 1</xref>(a) has been designed in 0.13 μm CMOS technology and simulated using ADS software. The value of the source resistance R<sub>S</sub> = 50 Ω and the input transistor M<sub>1</sub> has W/L ratio of 44.73 &#181;m/ 0.13 &#181;m. It is biased at 1 mA and have a gate-source capacitance of 60 fF. The LNA is optimized at 15 GHz by the proper selection of the on-chip inductor parameters. The inductor has 5-levels, 4.75-turns, and squirrel shape that provides 1.08 nH inductance and its nonidealities series resistance of 2.5 Ω, overlap capacitance of 0.8 fF and the oxide capacitance between the spiral and the substrate of 21 fF with 2 &#181;m width and 1 &#181;m spacing between turns. It is designed to have a very small overlap capacitance and a series resistance to reduce the total LNA noise figure. The effect of the capacitance due to the ESD protection diodes, QFN package parasitic and bonding pad structure is taken in consideration during the design of the LNA circuit. The cascade transistor M<sub>2</sub> is designed to have the same dimensions to decrease the power consumption at output. The output inductor L<sub>o</sub> used to resonate with the output cascade capacitance and provide matching with the coupling capacitors C<sub>1</sub> and C<sub>2 </sub>at the operating frequency ƒ<sub>o</sub>.</p><p>In our design, we use on-chip spiral inductor at the output and we include the inductor nonidealities to be part of the circuit. The inductor overlap capacitance is considered a part of the output capacitance and the inductor series resistance a part of the cascade output resistance. The value of L<sub>o</sub> used in our simulation is 0.415 nH at an operating frequency of 15 GHz.</p><p><xref ref-type="table" rid="table1">Table 1</xref> gives the simulated results of the LNA performance using on-chip spiral inductor compared with off-chip inductor at different values of a parallel parasitic capacitance C<sub>p</sub>. From the simulated results, with off-chip inductor, the noise figure (NF) highly increases with increasing C<sub>P</sub>. Also, the power gain (A<sub>p</sub>), input and output matching decrease to reach no matching when the parasitic capacitance is higher than the gate-source capacitance of input transistor M<sub>1</sub>. Since, the parasitic value is undetermined and depends on the fabrication, the off-chip inductor is not effective in LNA design. The LNA with on-chip inductor has a higher power gain (A<sub>p</sub>), higher voltage gain (A<sub>v</sub>) compared with LNA with off-chip inductor. It also has lower noise figure and better input and output matching compared with LNA with off-chip inductor.</p><p><xref ref-type="table" rid="table2">Table 2</xref> gives the simulated results of LNA with different layers of on-chip inductor (N = 1, 3 and 5) with a parasitic capacitance of 120 fF. Increasing the number of the metal layers (N) decreases the inductor resistance, increases the power gain, improves the matching and reduces the noise figure. Figures 4 and 5 show the variation of the LNA noise figure with the frequency for different layers of the on-chip inductor (N = 1, 3 and 5) at two different values of the parasitic capacitance C<sub>p</sub> (C<sub>p</sub> = 0 and 120 fF). As illustrated in the figures, increasing the number of the on-chip inductor layers reduces the LNA noise figure due to decrease the inductor resistance. Figures 6-8 show the simulated LNA gain, input and output matching and noise figure using input matching capacitor and 5-layer on-chip spiral inductor. The results indicate that the maximum gain occurs at 15 GHz. The value of the power gain (A<sub>P</sub>), input and output impedances matching (S<sub>11</sub> and S<sub>22</sub>), and noise figure are 11.087 dB, –17.93 dB, –10.04 dB, and 1.784 dB, respectively.</p></sec></body><back><ref-list><title>References</title><ref id="scirp.23644-ref1"><label>1</label><mixed-citation publication-type="other" xlink:type="simple">D. K. Shaeffer and T. H. Lee: “A 1.5 V, 1.5 GHz CMOS Low Noise Amplifier,” IEEE Journal of Solid-State Circuits, Vol. 35, No. 2, 1999, pp. 745-759.</mixed-citation></ref><ref id="scirp.23644-ref2"><label>2</label><mixed-citation publication-type="other" xlink:type="simple">Y.-H. Yu, Y.-S. Yang and Y.-J. Chen: “A Compact Wideband CMOS Low Noise Amplifier with Gain Flatness Enhancement,” IEEE Journal of Solid-State Circuits, Vol. 45, No. 3, 2010, pp. 502-509. 
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